Nanoscale compression of polymer microspheres by atomic force microscopy

Langmuir

Volumn 20, Issue 17, 2004, Pages 7015-7020

  Tan, Susheng ^a   Sherman Jr , Robert L ^a   Ford, Warren T ^a  

^a OKLAHOMA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY (AFM); COMPRESSIVE MODULI; FILM FORMATION; HERTZ'S THEORY;

ATOMIC FORCE MICROSCOPY; CHEMICAL INDUSTRY; DEFORMATION; DENDRIMERS; MATHEMATICAL MODELS; POLYSTYRENES; VAN DER WAALS FORCES;

POLYMERS;

DEFORMATION; MATHEMATICAL MODELS; MICROSPHERES; POLYMERS; POLYSTYRENE;

MICROSPHERE; NANOMATERIAL; POLY(VINYLBENZYLTRIMETHYLAMMONIUM CHLORIDE); POLYSTYRENE DERIVATIVE; QUATERNARY AMMONIUM DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL MODEL; CHEMISTRY; COMPRESSIVE STRENGTH; METHODOLOGY; PARTICLE SIZE; SURFACE PROPERTY; TEMPERATURE;

COMPRESSIVE STRENGTH; MICROSCOPY, ATOMIC FORCE; MICROSPHERES; MODELS, CHEMICAL; NANOSTRUCTURES; PARTICLE SIZE; POLYSTYRENES; QUATERNARY AMMONIUM COMPOUNDS; SURFACE PROPERTIES; TEMPERATURE;

EID: 4344587083     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la049597c     Document Type: Article

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