Scanning tunneling microscopy study of epitaxial growth of PbSe thin film on BaF2 (1 1 1)

Journal of Crystal Growth

Volumn 294, Issue 2, 2006, Pages 179-183

  Wu, H F ^a   Zhang, H J ^a   Lu, Y H ^a   Xu, T N ^a   Si, J X ^a   Li, H Y ^a   Bao, S N ^a   Wu, H Z ^a   He, P ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

A1. Scanning tunneling microscopy; A1. Spirals; A1. Threading dislocation; A1. V defects; B2. PbSe thin film

Indexed keywords

SPIRAL STRUCTURES; SPIRALS; THREADING DISLOCATION;

BARIUM COMPOUNDS; CRYSTAL DEFECTS; EPITAXIAL GROWTH; FILM GROWTH; GROWTH RATE; LEAD COMPOUNDS; SCANNING TUNNELING MICROSCOPY;

THIN FILMS;

EID: 33947096458     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.06.030     Document Type: Article

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