X-ray photoelectron spectroscopy of erbium-activated-silica-hafnia waveguides

Journal of Non-Crystalline Solids

Volumn 353, Issue 5-7, 2007, Pages 502-505

  Minati, L ^a   Speranza, G ^a   Ferrari, M ^b   Jestin, Y ^b   Chiasera, A ^b  

^a ITC IRST   (Italy)

^b IFN CNR   (Italy)

Author keywords

Silica hafnia; Waveguides; XPS

Indexed keywords

BINDING ENERGY; HAFNIUM COMPOUNDS; PHASE SEPARATION; SILICA; SOL-GEL PROCESS; X RAY PHOTOELECTRON SPECTROSCOPY;

HAFNIUM SILICATE; MOLAR CONCENTRATION; MOLAR RATIO; SILICA-HAFNIA;

PLANAR WAVEGUIDES;

EID: 33847672245     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2006.10.018     Document Type: Article

References (12)

1. Polman A. J. Appl. Phys. 82 (1997) 1
2. Forastiere M.A., Pelli S., Righini G.C., Guglielmi M., Ahmad M.M., McCarthy O., Yeatman E., and Vannucci A. Fiber Int. Opt. 20 (2001) 29
3. Zampedri L., Righini G.C., Portales H., Pelli S., Nunzi Conti G., Montagna M., Mattarelli M., Gonçalves R.R., Ferrari M., Chiasera A., Bouazaoui M., and Armellini C. J. Non-Cryst. Solids 345&346 (2004) 580
4. Gonçalves R.R., Carturan G., Zampedri L., Ferrari M., Montagna M., Chiasera A., Righini G.C., Pelli S., Ribeiro S.J.L., and Messaddeq Y. Appl. Phys. Lett. 81 (2002) 28
5. Gonçalves R.R., Carturan G., Zampedri L., Ferrari M., Montagna M., Righini G.C., Pelli S., Ribeiro S.J.L., and Messaddeq Y. Opt. Mater. 25 (2004) 131
6. Rayner Jr. G.B., Kang D., Zhang Y., and Lucovsky G. J. Vac. Sci. Technol. B 20 (2002) 1748
7. Kim H., and McIntyrea P.C. J. Appl. Phys. 92 (2002) 5094
8. Guittet M.J., Crocombette J.P., and Gautier-Soyer M. Phys. Rev. B 63 (2001) 125117
9. He G., Liu M., Zhu L.Q., Chang M., Fang Q., and Zhang L.D. Surf. Sci. 576 (2005) 67
10. Kirsch P.D., Kang C.S., Lonzano J., Lee J.C., and Ekerdt J.G. J. Appl. Phys. 91 (2002) 4353
11. Oshima M., Toyoda S., Okumura T., Okabayashi J., kumigashira H., Ono K., niwa M., Usuda K., and Hirashita N. Appl. Phys. Lett. 83 (2003) 2172
12. NIST Electron Effective Attenuation Length Database (EAL).