Processing and properties of ferroelectric relaxor lead scandium tantalate Pb(Sc1/2Ta1/2)O3 thin films

Journal of Materials Research

Volumn 22, Issue 1, 2007, Pages 217-232

  Brinkman, Kyle ^a,b   Wang, Y ^a   Cantoni, M ^a   Su, D ^a,c   Setter, Nava ^a   Petrov, P K ^d  

^a EPFL   (Switzerland)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^d LONDON SOUTH BANK UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; DIELECTRIC FILMS; LEAD COMPOUNDS; METALLOGRAPHIC MICROSTRUCTURE; PERMITTIVITY; TENSILE STRESS; THERMAL STRESS;

CHEMICAL SOLUTION DEPOSITION; FERROELECTRIC RELAXOR;

FERROELECTRIC THIN FILMS;

EID: 33847667204     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2007.0023     Document Type: Article

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