Effect of thermal expansion mismatch on the dielectric peak temperature of thin film relaxors

Journal of Applied Physics

Volumn 91, Issue 3, 2002, Pages 2295-2301

  Catalan, G ^a   Corbett, M H ^a   Bowman, R M ^a   Gregg, J M ^a  

^a QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MAXIMA; DIELECTRIC PEAKS; FREQUENCY DEPENDENCE; IN-PLANE STRAINS; ORIENTED THIN FILMS; RELAXORS; SEMI-EMPIRICAL; TEMPERATURE DEPENDENCE; THERMAL EXPANSION MISMATCH; THERMODYNAMIC POTENTIALS; THIN FILM RELAXORS;

LEAD; PULSED LASER DEPOSITION; THIN FILM CIRCUITS;

THIN FILMS;

EID: 33845426515     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1429761     Document Type: Article

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