A tin whisker risk assessment algorithm

Proceedings - 2005 International Symposium on Microelectronics, IMAPS 2005

Volumn , Issue , 2005, Pages 61-65

  Fang, Tong ^a   Osterman, Michael ^a   Pecht, Michael ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Distribution; Risk; Tin whisker; Whisker growth

Indexed keywords

DISTRIBUTION; ELECTRICALLY CONDUCTIVE; ELECTRONIC MANUFACTURER; GLOBAL TRANSITIONS; PROBABILISTIC APPROACHES; STATISTICAL DISTRIBUTION; TIN WHISKER; WHISKER GROWTH;

ALGORITHMS; CRYSTAL WHISKERS; LEAD; MANUFACTURE; MICROELECTRONICS; MONTE CARLO METHODS; RISK PERCEPTION; RISKS;

TIN;

EID: 84876898392     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. S. Ganesan and M. Pecht, Lead-free Electronics, 2004 Edition, CALCE EPSC Press, University of Maryland, College Park, MD.
2. J. Brusse, "Tin Whisker Observations on Pure Tin-plated Ceramic Chip Capacitors", AESF SUR/FIN Proceedings, June 24-27, 2002.
3. B.Z. Lee and D.N. Lee, "Spontaneous Growth Mechanism of Tin Whiskers", Acta Materials, Vol. 46, No. 10, pp. 3701-3714, 1998.
4. C. Xu, Y. Zhang, C. Fan, and J. Abys, "Understanding Whisker Phenomenon: The Driving Force for Whisker Formation", CircuiTree, pp. 10-21, May 2002.
5. D. Pinsky, M. Osterman, and S. Ganesan, "Tin Whiskering Risk Factors", IEEE Transactions on Components and Packaging Technologies, Vol. 27, No. 2, pp. 427-431, June 2004.
6. S. Okada, S. Higuchi, and T. Ando, "Field Reliability Estimation of Tin Whiskers Generated by Thermal-Cycling Stress", Murata Manufacturing Corporation, Ltd, 2003.
7. G.T. Galyon and R. Gedney, "Avoiding Tin Whisker Reliability Problems", Circuits Assembly, pp. 26-31, Aug. 2004.
8. T. Fang, M. Osterman, and M. Pecht, "Statistical Analysis of Tin Whisker Growth", Microelectronics Reliability, Accepted for Publication on May 9th, 2005.
9. J. Smetana, "NEMI Tin Whisker User Group - Tin Whisker Acceptance Test Requirements", NEMI Tin Whisker Workshop, June 1-2, 2004, Las Vegas, NV.