Thickness dependence of electrical properties in (0 0 1) oriented lead zirconate titanate films by laser ablation

Materials Science and Engineering: B

Volumn 138, Issue 1, 2007, Pages 51-54

  Zhu, T J ^a,b   Lu, L ^b   Lai, M O ^b   Soh, A K ^c  

^a ZHEJIANG UNIVERSITY   (China)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^c UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Ferroelectric properties; Pb(Zr,Ti)O3; Pulsed laser deposition; Size effect; Thin film

Indexed keywords

COERCIVE FORCE; CURRENT VOLTAGE CHARACTERISTICS; ELECTROCHEMICAL ELECTRODES; FERROELECTRICITY; HYSTERESIS; LASER ABLATION; LEAD COMPOUNDS; PULSED LASER DEPOSITION;

LEAD ZIRCONATE TITANATE FILMS; PB(ZR,TI)O3; SHOTTKY BARRIERS; SIZE EFFECT;

THIN FILMS;

EID: 33847220790     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2007.01.022     Document Type: Article

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