Growth and characterization of (001)-oriented Pb(Zr0.52Ti 0.48)O3/LaNiO3/LaAlO3 heterostructures prepared by pulsed laser deposition

Applied Physics A: Materials Science and Processing

Volumn 80, Issue 7, 2005, Pages 1517-1522

  Zhu, T J ^a   Lu, L ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRODES; LANTHANUM COMPOUNDS; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING LEAD COMPOUNDS; SEMICONDUCTOR GROWTH; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

COERCIVE FIELD; INTERDIFFUSION; LEAD ZIRCONATE TITANATE (PZT); REMANENT POLARIZATION;

HETEROJUNCTIONS;

EID: 18544367355     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-003-2379-y     Document Type: Article

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