Analysis and design optimization of electrooptic interferometric modulators for microphotonics applications

Journal of Lightwave Technology

Volumn 24, Issue 6, 2006, Pages 2340-2345

  Chen, Ding Yuan ^b   Phillips, Jamie D ^a,b  

^a IEEE

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Integrated optics; Interferometric modulators; Linear electrooptic (EO) effect; Modulation depth; Optical sensors; Polarization insensitivity; Thermal stability

Indexed keywords

ELECTRODES; ELECTROMAGNETIC WAVE POLARIZATION; MODULATORS; OPTICAL SENSORS; OPTIMIZATION; PRODUCT DESIGN; THERMODYNAMIC STABILITY;

ELECTROOPTIC INTERFEROMETRIC MODULATORS; LINEAR ELECTROOPTIC EFFECT; POLARIZATION INSENSITIVITY; SWITCHING VOLTAGE;

MACH-ZEHNDER INTERFEROMETERS;

EID: 33847213129     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2006.874603     Document Type: Article

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