Measurement of the Pockels coefficient of lead zirconate titanate thin films by a two-beam polarization interferometer with a reflection configuration

Journal of the Optical Society of America B: Optical Physics

Volumn 15, Issue 7, 1998, Pages 1940-1946

  Spirin, Vasilii V ^a   Lee, Changho ^a   No, Kwangsoo ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032396316     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.15.001940     Document Type: Article

References (17)

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