Extraction of electro-optic coefficient in thin-film linear electro-optic Mach-Zehnder interferometers with nonperiodic intensity-voltage output characteristics

Optical Engineering

Volumn 44, Issue 3, 2005, Pages 1-6

  Chen, Ding Yuan ^a   Phillips, Jamie D ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Electro optics; Ferroelectric thin films; Integrated optics; Mach Zehnder interferometer; Optical intensity modulators

Indexed keywords

ELECTRIC FIELDS; ELECTRIC POTENTIAL; ELECTROOPTICAL EFFECTS; FERROELECTRIC THIN FILMS; INTERFEROMETERS; LIGHT MODULATORS; MATRIX ALGEBRA; REFRACTIVE INDEX;

JONES MATRIX METHOD; MACH-ZEHNDER INTERFEROMETER; OPTICAL INTENSITY MODULATORS;

INTEGRATED OPTICS;

EID: 24744470691     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1872032     Document Type: Article

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