Electrooptic characteristics of thin-film PLZT waveguide using ridge-type mach-Zehnder modulator

Journal of Lightwave Technology

Volumn 21, Issue 8, 2003, Pages 1820-1827

  Thapliy, Roshan ^a   Okano, Yasunori ^a   Nakamura, Shigetoshi ^a  

^a FUJI XEROX CO LTD   (Japan)

Author keywords

DC drift; Electrooptic (EO) effect; PLZT waveguide

Indexed keywords

DRY ETCHING; ELECTROOPTICAL EFFECTS; HYSTERESIS; LIGHT MODULATORS; OPTICAL DESIGN; OPTICAL FILMS; OPTICAL KERR EFFECT; THIN FILMS;

LEAD ZIRCONATE TITANATE WAVEGUIDE; MACH-ZEHNDER MODULATOR; RIDGE TYPE MODULATOR; THIN FILM WAVEGUIDE;

OPTICAL WAVEGUIDES;

EID: 0042888696     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2003.815511     Document Type: Article

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