Non-contact wafer probe using wireless probe cards

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 447-452

  Sellathamby, Chris V ^a   Reja, Mahbub M ^a   Fu, Lin ^a   Bai, Brenda ^a   Reid, Edwin ^a   Slupsky, Steven H ^a   Filanovsky, Igor M ^b   Iniewski, Kris ^b  

^a Scanimetrics Inc   (Canada)

^b Department of Electrical and Computer Engineering ^*  (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANTENNAS; CMOS INTEGRATED CIRCUITS; ELECTRONIC EQUIPMENT; INTEGRATED CIRCUITS; SILICON WAFERS; TRANSCEIVERS;

DEVICE UNDER TEST (DUT); FUNCTIONALITY TESTING; SEMICONDUCTOR WAFERS; WIRELESS PROBE CARDS;

AUTOMATIC TESTING;

EID: 33847108867     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584004     Document Type: Conference Paper

References (12)

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