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Volumn , Issue , 2004, Pages 97-101

Impact of technology scaling on RF CMOS

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY RESPONSE; MICROPROCESSOR CHIPS; NATURAL FREQUENCIES; OSCILLATIONS; PERSONAL COMMUNICATION SYSTEMS; SPURIOUS SIGNAL NOISE; TECHNOLOGY TRANSFER; TRANSCEIVERS;

EID: 14844291378     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (14)
  • 1
    • 0035054713 scopus 로고    scopus 로고
    • A fully integrated single-chip SOC for bluetooth
    • F. O. Eynde et al., "A Fully Integrated Single-Chip SOC for Bluetooth", IEEE ISSCC Tech. Dig., pp. 196-197, 2001.
    • (2001) IEEE ISSCC Tech. Dig. , pp. 196-197
    • Eynde, F.O.1
  • 2
    • 0038645169 scopus 로고    scopus 로고
    • A 1.9GHz fully integrated CMOS DECT transceiver
    • A. Leeuwenburgh et al., "A 1.9GHz Fully Integrated CMOS DECT Transceiver", IEEE ISSCC Tech. Dig., page 450, 2003.
    • (2003) IEEE ISSCC Tech. Dig. , pp. 450
    • Leeuwenburgh, A.1
  • 3
    • 0036116899 scopus 로고    scopus 로고
    • A 27mW GPS radio in 0.35μm CMOS
    • F. Behbahani et al., "A 27mW GPS Radio in 0.35μm CMOS", IEEE ISSCC Tech. Dig., page 398, 2002.
    • (2002) IEEE ISSCC Tech. Dig. , pp. 398
    • Behbahani, F.1
  • 4
    • 0037969347 scopus 로고    scopus 로고
    • A dual mode 802.11b/bluetooth radio in 0.35μm CMOS
    • H. Darabi et al., "A Dual Mode 802.11b/Bluetooth Radio in 0.35μm CMOS", IEEE ISSCC Tech. Dig., page 86, 2003.
    • (2003) IEEE ISSCC Tech. Dig. , pp. 86
    • Darabi, H.1
  • 5
    • 14844290759 scopus 로고    scopus 로고
    • University of California Berkeley, Predective Technology Model, "http://www-device.eecs.berkeley.edu/~ptm/".
    • Predective Technology Model
  • 8
    • 1642395709 scopus 로고    scopus 로고
    • IP3) for nanoscale RF CMOS devices
    • February
    • IP3) for Nanoscale RF CMOS Devices", IEEE Microwave Wireless Compon. Lett., vol. 14, n. 2, pp. 83-885, February 2004.
    • (2004) IEEE Microwave Wireless Compon. Lett. , vol.14 , Issue.2 , pp. 83-885
    • Choi, W.Y.1
  • 10
    • 0034453901 scopus 로고    scopus 로고
    • RF-distortion in deep-submicron CMOS technologies
    • R. Van Langevelde et al., "RF-Distortion in Deep-Submicron CMOS Technologies", Proc. IEDM, pp. 807-810, 2000.
    • (2000) Proc. IEDM , pp. 807-810
    • Van Langevelde, R.1
  • 11
    • 0035423685 scopus 로고    scopus 로고
    • RF-CMOS performance trends
    • August
    • P. H. Woerlee et al., "RF-CMOS Performance Trends", IEEE Trans. Electron Devices, vol. 48, n. 8, pp. 1776-1782, August 2001.
    • (2001) IEEE Trans. Electron Devices , vol.48 , Issue.8 , pp. 1776-1782
    • Woerlee, P.H.1
  • 12
    • 0034479913 scopus 로고    scopus 로고
    • New insights on RF CMOS stability related to bias, scaling, and temperature
    • J.-G. Su et al., "New Insights on RF CMOS Stability Related to Bias, Scaling, and Temperature", Proc. IEDM, pp. 40-43, 2000.
    • (2000) Proc. IEDM , pp. 40-43
    • Su, J.-G.1
  • 13
    • 0036160796 scopus 로고    scopus 로고
    • Determining the onset frequency of non-quasistatic effects of the MOSFET in AC simulation
    • January
    • A. F.-L. Ng et al., "Determining the Onset Frequency of Non-quasistatic Effects of the MOSFET in AC Simulation", IEEE Elec. Dev. Letters, vol. 23, n. 1, pp. 37-39, January 2002.
    • (2002) IEEE Elec. Dev. Letters , vol.23 , Issue.1 , pp. 37-39
    • Ng, A.F.-L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.