High-performance ADC linearity test using low-precision signals in non-stationary environments

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 1182-1191

  Jin, Le ^a   Parthasarathy, Kumar ^b   Kuyel, Turker ^b   Geiger, Randall ^a   Chen, Degang ^a  

^a Iowa State University of Science and Technology   (United States)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FULL CODE TESTS; LOW PRECISION SIGNALS; OF ADC PRODUCTION TESTS; SELF CALIBRATION;

BUILT-IN SELF TEST; CALIBRATION; CODES (SYMBOLS); COMPUTER CONTROL; COMPUTER SIMULATION; STORAGE ALLOCATION (COMPUTER);

ANALOG TO DIGITAL CONVERSION;

EID: 33847105003     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584086     Document Type: Conference Paper

References (12)

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