A new methodology for ADC test flow optimization

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 201-209

  Bernard, S ^a   Comte, M ^a   Azais F ^a   Bertrand, Y ^a   Renovell, M ^a  

^a UNIV MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COSTS; DIGITAL INTEGRATED CIRCUITS; ELECTRONIC EQUIPMENT TESTING; FAST FOURIER TRANSFORMS; TRANSFER FUNCTIONS;

MIXED-SIGNAL SYSTEM;

ANALOG TO DIGITAL CONVERSION;

EID: 0142246943     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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2. T. Kuyel, "Linearity Testing Issues of Analog to Digital Converters", Proc. International Test Conference, pp. 747-756, 1999.
3. European Project DYNAD, "Methods and draft standards for the DYNamic characterization and testing of Analog-to-Digital converters", published on the .web at http://www.fe.up.pt/̃hsm/dynad/
4. M. Mahoney, "DSP-Based Testing of Analog and Mixed-Signal Circuits", IEEE Computer Society Press, ISBN 0-8186-0785-8, 1987.
5. H.S. Mendonça, J.M. Silva, J.S. Matos, "A Comparison of ADC Dynamic Test Methods", Proc. Design of Circuits and Integrated Systems Conference, pp. 102-107, 2000.
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8. F. Azaïs, S. Bernard, M. Comte, Y. Bertrand and M. Renovell, "Estimating Static Parameters of A-to-D Converters from Spectral Analysis", Proc. IEEE Latin American Test Workshop, pp. 174-179, 2002.
9. V. Liberali, F. Maloberti and M. Stramesi, "ADC Characterizations Using the Code Density Test Method With Deterministic Sampling", Proc. International Mixed Signal Testing Workshop, pp. 113-118, 1996.
10. M. Comte, F. Azaïs, S. Bernard, Y. Bertrand and M. Renovell, "Analysis of the Specification Influence on the Efficiency of an Optimized Test Flows for ADCs", Proc. International Mixed Signal Testing Workshop, pp. 185-190, 2003.