Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 3, 2005, Pages 1188-1199

  Jin, Le ^a   Parthasarathy, Kumar ^b   Kuyel, Turker ^b   Chen, Degang ^a   Geiger, Randall L ^a  

^a Iowa State University of Science and Technology   (United States)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

Analog to digital converters (ADCs); Integral nonlinearity (INL); Linearity test; Stimulus error identification and removal (SEIR)

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; BUILT-IN SELF TEST; COMPUTER SIMULATION; DATA ACQUISITION; ERROR ANALYSIS; MATHEMATICAL MODELS; SIGNAL GENERATORS; SPURIOUS SIGNAL NOISE;

INTEGRAL LINEARITY (INL); LINEARITY TEST; STIMULUS ERROR IDENTIFICATION AND REMOVAL (SEIR);

ANALOG TO DIGITAL CONVERSION;

EID: 20544437223     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2005.847240     Document Type: Article

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