Application of supply current testing to analogue circuits, towards a structural analogue test methodology ?!

Proceedings - European Test Workshop 1999, ETW 1999

Volumn , Issue , 1999, Pages 51-56

  Manhaeve, H ^a   Verfaillie, J ^b   Straka, B ^c   Cornil, J P ^b  

^a Katholieke Hogeschool Brugge Oostende   (Belgium)

^b LUCENT TECHNOLOGIES   (United States)

^c CEDO Brno   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG CIRCUITS; COST EFFECTIVENESS; COST REDUCTION; DIGITAL SUBSCRIBER LINES; MODEMS; TELEPHONE LINES; TIMING CIRCUITS;

ANALOG AND MIXED-SIGNAL TEST; MEASUREMENT RANGE; PRODUCTION TEST; STRUCTURAL ANALOGUE; SUPPLY CURRENTS; TEST COST REDUCTION; TEST METHODOLOGY; WORK IN PROGRESS;

TESTING;

EID: 0142257981     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETW.1999.804221     Document Type: Conference Paper

References (11)

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