One-dimensional-based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction

International Journal of Production Research

Volumn 45, Issue 6, 2007, Pages 1297-1321

  Tsai, D M ^a   Chuang, S T ^a   Tseng, Y H ^a  

^a YUAN ZE UNIVERSITY   (Taiwan)

Author keywords

Automated inspection; Computer vision; Defect detection; Fourier transforms; Thin film transistor liquid crystal display (TFT LCD)

Indexed keywords

CRYSTAL DEFECTS; IMAGE RECONSTRUCTION; IMAGE SEGMENTATION; LIQUID CRYSTAL DISPLAYS; OPTICAL RESOLVING POWER; PATTERN MATCHING;

DEFECT INSPECTION; FOURIER IMAGE RECONSTRUCTION; FOURIER SPECTRUM; FOURIER TRANSFORM;

THIN FILM TRANSISTORS;

EID: 33847035619     PISSN: 00207543     EISSN: 1366588X     Source Type: Journal    
DOI: 10.1080/00207540600622464     Document Type: Article

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