Magnification and mass resolution in local-electrode atom probes

Ultramicroscopy

Volumn 65, Issue 1-2, 1996, Pages 119-129

  Bajikar, Sateesh S ^a   Larson, David J ^a,b   Kelly, Thomas F ^a,b   Camus, Patrick P ^b  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

^b NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODES; ELECTRON ENERGY LEVELS; IONS; OPTICAL RESOLVING POWER; PROBES;

ENERGY DEFICIT RELATED DISPERSION; LOCAL ELECTRODE ATOM PROBE;

ELECTRON MICROSCOPES;

ARTICLE; SCANNING FORCE MICROSCOPY;

EID: 0030250520     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(96)00064-2     Document Type: Article

References (12)

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10. [10] M.K. Miller and G.D.W. Smith, Atom Probe Microanalysis - Principles and Applications to Materials Problems (Materials Research Society, Pittsburgh, 1989) p. 28.
11. [11] T.T. Tsong, Atom-Probe Field Ion Microscopy (Cambridge University Press, Cambridge, 1990) p. 147.
12. [12] M.K. Miller and G.D.W. Smith, Atom Probe Microanalysis - Principles and Applications to Materials Problems (Materials Research Society, 1989) p. 138.