Measurements of field enhancement introduced by a local electrode

Ultramicroscopy

Volumn 89, Issue 1-3, 2001, Pages 163-167

  Huang, M ^a   Cerezo, A ^a   Clifton, P H ^b   Smith, G D W ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b Seagate Technology   (Ireland)

Author keywords

FIM; Instrument control and alignment

Indexed keywords

ATOMS; FIELD EMISSION MICROSCOPES; SPECIMEN PREPARATION;

FIELD ENHANCEMENT; SCANNING ATOM PROBE (SAP);

ELECTRODES;

ARTICLE; CONTRAST ENHANCEMENT; ELECTRIC POTENTIAL; ELECTRODE; IMAGING; SCANNING PROBE MICROSCOPY; TECHNIQUE; TECHNOLOGY;

EID: 0035182744     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(01)00108-5     Document Type: Article

References (9)