Measurements of current spreading length and design of GaN-based light emitting diodes

Applied Physics Letters

Volumn 90, Issue 6, 2007, Pages

  Kim, Hyunsoo ^a   Cho, Jaehee ^a   Lee, Jeong Wook ^a   Yoon, Sukho ^a   Kim, Hyungkun ^a   Sone, Cheolsoo ^a   Park, Yongjo ^a   Seong, Tae Yeon ^b  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^b Korea University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC RESISTANCE; GALLIUM NITRIDE; MATHEMATICAL MODELS;

CURRENT DISTRIBUTION MODELS; CURRENT SPREADING LENGTHS; P-TYPE REFLECTORS; STANDARD REFLECTORS;

LIGHT EMITTING DIODES;

EID: 33846982209     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2450670     Document Type: Article

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