A UNISON framework for analyzing alternative strategies of IC final testing for enhancing overall operational effectiveness

International Journal of Production Economics

Volumn 107, Issue 1, 2007, Pages 20-30

  Chien, Chen Fu ^a   Wang, Hung Ju ^a   Wang, Min ^b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b CHAOYANG UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

Decision analysis; IC final test; Manufacturing strategy; Operational effectiveness; Semiconductor manufacturing

Indexed keywords

COST ACCOUNTING; DECISION THEORY; INTEGRATED CIRCUIT TESTING; RISK ASSESSMENT; SEMICONDUCTOR DEVICE MANUFACTURE;

IC FINAL TESTS; MANUFACTURING STRATEGY; OPERATIONAL EFFECTIVENESS; SEMICONDUCTOR MANUFACTURING;

STRATEGIC PLANNING;

EID: 33846939229     PISSN: 09255273     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijpe.2006.03.010     Document Type: Article

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