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Volumn , Issue , 1995, Pages 224-232
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Test SPC: a process to improve test system integrity
a
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Author keywords
[No Author keywords available]
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Indexed keywords
DATA ACQUISITION;
INTEGRATED CIRCUIT MANUFACTURE;
PERFORMANCE;
PRODUCTIVITY;
QUALITY CONTROL;
STATISTICAL PROCESS CONTROL;
VLSI CIRCUITS;
AVERAGE OUTGOING QUALITY LEVEL;
AVERAGE QUALITY LEVEL;
LOT;
LOT ACCEPT;
LOT ACCEPT CERTIFICATION;
LOT SAMPLE TEST;
SAMPLING PLAN;
TEST SYSTEM INTEGRITY;
INTEGRATED CIRCUIT TESTING;
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EID: 0029542201
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (0)
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