Test SPC: a process to improve test system integrity

IEEE International Test Conference (TC)

Volumn , Issue , 1995, Pages 224-232

  Benitez, Willie ^a   Marrero, Deo ^a   Mirizzi, Doug ^a   Ohmart, Dale ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; INTEGRATED CIRCUIT MANUFACTURE; PERFORMANCE; PRODUCTIVITY; QUALITY CONTROL; STATISTICAL PROCESS CONTROL; VLSI CIRCUITS;

AVERAGE OUTGOING QUALITY LEVEL; AVERAGE QUALITY LEVEL; LOT; LOT ACCEPT; LOT ACCEPT CERTIFICATION; LOT SAMPLE TEST; SAMPLING PLAN; TEST SYSTEM INTEGRITY;

INTEGRATED CIRCUIT TESTING;

EID: 0029542201     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)