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Volumn 4, Issue 4-6, 2003, Pages 365-383

Data value development to enhance competitive advantage: A retrospective study of EDA systems for semiconductor fabrication

Author keywords

Applied statistics; Data mining; Engineering data analysis; Semiconductor manufacturing; System development

Indexed keywords

COMPETITION; COMPETITIVE INTELLIGENCE; DATA MINING; INFORMATION TECHNOLOGY; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0345357660     PISSN: 14606720     EISSN: None     Source Type: Journal    
DOI: 10.1504/ijstm.2003.003621     Document Type: Article
Times cited : (27)

References (17)
  • 4
    • 0345277564 scopus 로고    scopus 로고
    • Challenges for use of statistical software tools in the semiconductor industry
    • Kittler, R. (2000) 'Challenges for use of statistical software tools in the semiconductor industry', Proceedings of Joint Statistical Meeting (JSM2000).
    • (2000) Proceedings of Joint Statistical Meeting (JSM2000)
    • Kittler, R.1
  • 5
    • 0004160694 scopus 로고    scopus 로고
    • Technology considerations for future semiconductor data management systems
    • Tobin, K.W. and Karnowski, T.P. (2000) 'Technology considerations for future semiconductor data management systems', Semiconductor Fabtech, 12th Edition, pp.57-63.
    • (2000) Semiconductor Fabtech, 12th Edition , pp. 57-63
    • Tobin, K.W.1    Karnowski, T.P.2
  • 9
    • 0345277563 scopus 로고    scopus 로고
    • Data mining for semiconductor yield forecasting
    • Srivastava, A.N. (1999) 'Data mining for semiconductor yield forecasting', Future Fab International, Vol. 7, pp.67-70.
    • (1999) Future Fab International , vol.7 , pp. 67-70
    • Srivastava, A.N.1
  • 11
    • 0034592742 scopus 로고    scopus 로고
    • Data mining solves tough semiconductor manufacturing problems
    • Gardner, M. and Bieker, J. (2000) 'Data mining solves tough semiconductor manufacturing problems', Proceedings KDD2000, pp.376-383.
    • (2000) Proceedings KDD2000 , pp. 376-383
    • Gardner, M.1    Bieker, J.2
  • 12
    • 0345277560 scopus 로고    scopus 로고
    • Developing data mining framework and methods for diagnosing semiconductor manufacturing defects and an empirical study of wafer acceptance test data in a wafer fab
    • Chien, C., Lin, T., Peng, C. and Hsu, S. (2001) 'Developing data mining framework and methods for diagnosing semiconductor manufacturing defects and an empirical study of wafer acceptance test data in a wafer fab', Journal of the Chinese Institute of Industrial Engineers, Vol. 18, No. 4, pp.37-48.
    • (2001) Journal of the Chinese Institute of Industrial Engineers , vol.18 , Issue.4 , pp. 37-48
    • Chien, C.1    Lin, T.2    Peng, C.3    Hsu, S.4
  • 15
    • 0344846284 scopus 로고    scopus 로고
    • Motorola engineering data analysis system: Ten years of analytical excellence
    • Paper 44-25, SUGI25
    • Whitney, C.M. and Fowler, L. (2000) 'Motorola engineering data analysis system: ten years of analytical excellence', Paper 44-25, SUGI25.
    • (2000)
    • Whitney, C.M.1    Fowler, L.2
  • 17
    • 0032025352 scopus 로고    scopus 로고
    • Developing a multidimensional measure of system-use in an organizational context
    • Doll, W.J. and Torkzadeh, G. (1998) 'Developing a multidimensional measure of system-use in an organizational context', Information and Management, Vol. 33, pp.171-185.
    • (1998) Information and Management , vol.33 , pp. 171-185
    • Doll, W.J.1    Torkzadeh, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.