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Volumn T124, Issue , 2006, Pages 86-90
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New development of self-interaction corrected DFT for extended systems applied to the calculation of native defects in 3C-SiC
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON;
DEFECTS;
DENSITY FUNCTIONAL THEORY;
OPTIMIZATION;
POSITIVE IONS;
FORMATION ENERGIES;
SILICON INTERSTITIALS;
SILICON CARBIDE;
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EID: 33846933395
PISSN: 02811847
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1088/0031-8949/2006/T124/017 Document Type: Article |
Times cited : (35)
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References (34)
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