Characterization of the "native" surface thin film on pure polycrystalline iron: A high resolution XPS and TEM study

Applied Surface Science

Volumn 253, Issue 9, 2007, Pages 4322-4329

  Bhargava, G ^a   Gouzman, I ^b   Chun, C M ^c   Ramanarayanan, T A ^a   Bernasek, S L ^a  

^a PRINCETON UNIVERSITY   (United States)

^b SOREQ NUCLEAR RESEARCH CENTER   (Israel)

^c EXXONMOBIL UPSTREAM RESEARCH COMPANY   (United States)

Author keywords

Hydroxide; Iron; Oxide; Surface; TEM; XPS

Indexed keywords

CURVE FITTING; IRON; OXIDES; PHASE DIAGRAMS; POLYCRYSTALLINE MATERIALS; SURFACE CHEMISTRY; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

HYDROXIDES; POLYCRYSTALLINE IRON; POURBAIX DIAGRAM;

THIN FILMS;

EID: 33846837389     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.09.047     Document Type: Article

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