A consistent method for quantitative XPS peak analysis of thin oxide films on clean polycrystalline iron surfaces

Applied Surface Science

Volumn 119, Issue 1-2, 1997, Pages 83-92

  Lin, Tien Chih ^a   Seshadri, Gayatri ^a   Kelber, Jeffry A ^a  

^a UNIVERSITY OF NORTH TEXAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; ELECTROCHEMICAL ELECTRODES; POLYCRYSTALLINE MATERIALS; PRESSURE EFFECTS; SURFACE PHENOMENA; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

THIN OXIDE FILMS; ULTRAHIGH VACUUM X RAY PHOTOELECTRON SPECTROSCOPY;

IRON OXIDES;

EID: 0031237967     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00167-0     Document Type: Article

References (41)

1. B.L. Maschhoff, N.R. Armstrong, Langmuir 7 (1991) 693.
2. V. Stambouli, C. Palacio, H.J. Mathieu, D. Landolt, Appl. Surf. Sci. 70/71 (1993) 240.
3. M. Kamrath, D. Zurawski, A. Wieckowski, Langmuir 6 (1990) 1683.
4. C. Jansson, P. Morgen, Surf. Sci. 233 (1990) 84.
5. M. Arbab, J.B. Hudson, Surf. Sci. 206 (1988) 317, and references therein.
6. P.A. Lee, K.F. Stork, B.L. Maschhoff, K.W. Nebesky, N.R, Armstrong, Surf. Interf. Anal. 17 (1991) 48.
7. D.J. Dwyer, S.R. Kelemen, A. Kaldor, J. Chem. Phys. 76 (1982) 1832.
8. D.J. Dwyer, G.W. Simmons, R.P. Wei, Surf. Sci. 64 (1977) 617.
9. M.W. Roberts, P.R. Wood, J. Electron Spectrosc. Rel. Phen. 11 (1977) 431.
10. S. Chang, W.H. Wade, J. Colloid Interf. Sci. 34 (1970) 413.
11. N.S. McIntyre, T.C. Chan, in: D. Briggs, M.P. Seah (Eds.), Practical Surface Analysis, 2nd ed., Vol. 1: Auger and X-ray Photoelectron Spectroscopy (Wiley, New York, 1990) p. 485.
12. T.L. Barr, Crit. Rev. Anal. Chem. 22 (1991) 113.
13. T.L. Barr, Crit. Rev. Anal. Chem. 22 (1991) 229.
14. C.S. Fadley, in: C.R. Brundle, X. Baker (Eds.), Electron Spectroscopy: Theory, Techniques, and Applications, Vol. 2 (Academic Press, New York, 1978) p. 2.
15. I.D. Welsh, P.M.A. Sherwood, Phys. Rev. B 40 (1989) 6386.
16. K.W. Nebesny, B.L. Maschhoff, N.R. Armstrong, Anal. Chem. 61 (1989) 469A.
17. B.L. Maschhoff, K.W. Nebesny, K.R. Zavadil, J.M. Fordemwalt, N.R. Armstrong, Spectrochim. Acta B 43 (1988) 535.
18. S. Tougaard, C. Jansson, Surf. Interf. Anal. 20 (1993) 1013.
19. P.M.A. Sherwood, J. Vac. Sci. Technol. A 14 (1995) 1424.
20. C.R. Brundel, T.J. Chuang, K. Wandelt, Surf. Sci. 68 (1977) 459.
21. J. Prasad, E. Murray, J.A. Kelber, Chem. Phys. Lett. 190 (1992) 187.
22. J.F. Moulder, W.F. Stickle, P.E. Sobol, K.D. Bomben, in: J. Chastain, R.C. King, Jr. (Eds.), Handbook of X-ray Photoelectron Spectrosocpy (Physical Electronics, Inc., Eden Prairie, Minnesota, 1995).
23. M.P. Soriaga, Prog. Surf. Sci. 39 (1992) 325.
24. G. Seshadri, T.-C. Lin, C.A. Ballinger, J.A. Kelber, Langmuir, in press.
25. ESCA Tools™, Version 4.6 (Surface/Interface Inc., Mountain View, CA).
26. MATLAB, Version 4.2 c1 (The Mathworks Inc., Natick, MA).
27. D.A. Shirley, Phys. Rev. B 5 (1972) 4709.
28. M.C. Burrell, N.R. Armstrong, Appl. Surf. Sci. 17 (1983) 53.
29. H.E. Bishop, Surf. Interf. Anal. 3 (1981) 272.
30. S. Tougaard, J. Electron Spectrosc. Rel. Phen. 52 (1990) 243.
31. G. Kurbatov, E. Darque-Ceretti, M. Aucouturier, Surf. Interf. Anal. 20 (1993) 402.
32. G. Kurbatov, E. Darque-Ceretti, M. Aucouturier, Surf. Interf. Anal. 18 (1992) 811.
33. V. Maurice, W.P. Yang, P. Marcus, J. Electrochem. Soc. 141 (1994) 3016.
34. M.P. Seah, Surf. Interf. Anal. 9 (1986) 85.
35. M.P. Seah, W.A. Dench, Surf. Interf. Anal. 1 (1979) 2.
36. D.R. Lide (Ed.), CRC Handbook of Chemistry and Physics, 74th ed. (CRC Press, Inc., Boca Raton, 1993).
37. H.J. Mathieu, M. Datta, D. Landolt, J. Vac. Sci. Technol. A 3 (1985) 331.
38. J.E. Fulghum, Surf. Interf. Anal. 20 (1993) 161.
39. D.W. Davis, M.S. Banna, D.A. Shirley, J. Chem. Phys. 60 (1974) 237.
40. D.W. Davis, D.A. Shirley, J. Electron Spectrosc. 3 (1974) 137, and references therein.
41. P.M.A. Sherwood, J. Chem. Soc. Faraday II 72 (1976) 1791.