메뉴 건너뛰기




Volumn 100-101, Issue , 1996, Pages 36-40

Simultaneous determination of composition and thickness of thin iron-oxide films from XPS Fe 2p spectra

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; COMPOSITION; ELECTRON EMISSION; ELECTRON SCATTERING; IRON OXIDES; SPECTRUM ANALYSIS; THICKNESS MEASUREMENT; THIN FILMS;

EID: 0030564396     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(96)00252-8     Document Type: Article
Times cited : (555)

References (19)
  • 8
    • 0026255575 scopus 로고
    • American Society for Testing and Materials, Surf. Interf. Anal. 17 (1991) 889.
    • (1991) Surf. Interf. Anal. , vol.17 , pp. 889
  • 13
    • 0001985361 scopus 로고
    • R.P. Gupta and S.K. Sen, Phys. Rev. B 10 (1974) 71; 12 (1975) 15.
    • (1975) Phys. Rev. B , vol.12 , pp. 15


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.