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Volumn 100-101, Issue , 1996, Pages 36-40
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Simultaneous determination of composition and thickness of thin iron-oxide films from XPS Fe 2p spectra
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Author keywords
[No Author keywords available]
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Indexed keywords
CALCULATIONS;
COMPOSITION;
ELECTRON EMISSION;
ELECTRON SCATTERING;
IRON OXIDES;
SPECTRUM ANALYSIS;
THICKNESS MEASUREMENT;
THIN FILMS;
FILM THICKNESS;
SHIRLEY TYPE BACKGROUND;
SPECTRUM RECONSTRUCTION;
THIN IRON OXIDE FILMS;
TOUGAARD METHOD;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 0030564396
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/0169-4332(96)00252-8 Document Type: Article |
Times cited : (555)
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References (19)
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