Growth of thin silver films on silicon oxide pretreated by low temperature argon plasma

Surface Science

Volumn 601, Issue 4, 2007, Pages 1026-1030

  Romanyuk, Andriy ^a   Steiner, Roland ^a   Mack, Iris ^a   Oelhafen, Peter ^a   Mathys, Daniel ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

Ion bombardment; Metal oxide interfaces; Nucleation; Photoelectron spectroscopy; Surface defects

Indexed keywords

ARGON; FILM GROWTH; INTERFACES (MATERIALS); ION BOMBARDMENT; NUCLEATION; PLASMAS; SILVER;

METAL-OXIDE INTERFACES; SURFACE DEFECTS;

THIN FILMS;

EID: 33846817392     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.11.044     Document Type: Article

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