Effect of cryogenic temperature deposition on Au contacts to bulk, single-crystal n-type ZnO

Applied Surface Science

Volumn 253, Issue 8, 2007, Pages 3766-3772

  Wright, J S ^a   Khanna, Rohit ^a   Voss, L F ^a   Stafford, L ^a   Gila, B P ^a   Norton, D P ^a   Pearton, S J ^a   Wang, Hung Ta ^b   Jang, S ^b   Anderson, T ^b   Chen, J J ^b   Kang, B S ^b   Ren, F ^b   Shen, H ^c   LaRoche, Jeffrey R ^d   Ip, Kelly ^d  

^a UNIVERSITY OF FLORIDA   (United States)

^b J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

^c U S ARMY RESEARCH LABORATORY   (United States)

^d RAYTHEON COMPANY   (United States)

Author keywords

Schottky contacts; ZnO

Indexed keywords

ANNEALING; OHMIC CONTACTS; OPTIMIZATION; SINGLE CRYSTALS; STOICHIOMETRY;

SCHOTTKY CONTACTS; SURFACE STOICHIOMETRY; TEMPERATURE DEPOSITION;

CRYOGENICS;

EID: 33846624672     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.07.090     Document Type: Article

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