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Volumn 1, Issue 23, 2006, Pages 75-80

Dislocation line broadening

Author keywords

Dislocations; Line profile analysis; Microstrain

Indexed keywords


EID: 33846426824     PISSN: 0930486X     EISSN: None     Source Type: Journal    
DOI: 10.1524/zksu.2006.suppl_23.75     Document Type: Conference Paper
Times cited : (8)

References (26)
  • 8
    • 0001856349 scopus 로고    scopus 로고
    • Ed. by R. L. Snyder, J. Fiala and H. J. Bunge, Oxford University Press, pp
    • R. I. Barabash, 1999, in Defect and Microstructure Analysis by Diffraction. Ed. by R. L. Snyder, J. Fiala and H. J. Bunge, (Oxford University Press), pp. 127-140.
    • (1999) Defect and Microstructure Analysis by Diffraction , pp. 127-140
    • Barabash, R.I.1
  • 9
    • 33846444189 scopus 로고    scopus 로고
    • R. I. Barabash, P. Klimanek, 2001, in Advances in Structure Analysis, edited by R. Kužel, J. Hašek (Prague: Czech and Slovak Crystallographic Assoc.) pp. 438-448.
    • R. I. Barabash, P. Klimanek, 2001, in Advances in Structure Analysis, edited by R. Kužel, J. Hašek (Prague: Czech and Slovak Crystallographic Assoc.) pp. 438-448.
  • 23
    • 33846462335 scopus 로고
    • PhD thesis, Delft University of Technology. The Netherlands
    • J. G. M. van Berkum, 1994, PhD thesis, Delft University of Technology. The Netherlands.
    • (1994)
    • van Berkum, J.G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.