X-ray scattering from interface dislocations in highly mismatched oxide epitaxial films

Zeitschrift fur Kristallographie, Supplement

Volumn 2, Issue 23, 2006, Pages 263-268

  Guinebretiere R ^a   Boulle, A ^a   Masson, O ^a   Dauger, A ^a  

^a CNRS   (France)

Author keywords

Epitaxial layer; Misfit dislocations; Reciprocal space mapping; X ray diffraction

Indexed keywords

EID: 33846422728     PISSN: 0930486X     EISSN: None     Source Type: Journal    
DOI: 10.1524/zksu.2006.suppl_23.263     Document Type: Conference Paper

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