Is there a Stobbs-Factor in off-axis electron holography?

Microscopy and Microanalysis

Volumn 9, Issue SUPPL. 3, 2003, Pages 46-47

  Lehmann, Michael ^a   Lichte, Hannes ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0142028716     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927603031118     Document Type: Conference Paper

References (3)

1. C.B. Boothroyd, Why don't high-resolution simulations and images match?, Journal of Microscopy 190 (1998) 99
2. Rüdiger R. Meyer and Angus Kirkland, The effects of electron and photon scattering on signal and noise transfer properties of scintillators in CCD cameras used for electron detection, Ultramicroscopy 75 (1998) 23
3. Many thanks are due Prof. Henny W. Zandbergen and Ides Büscher for providing the wedge-shaped GaAs sample, and Prof. Pierre Stadelmann for his EMS program used for object exit-wave simulation. The discussions with Prof. Dirk Van Dyck, Dr. Andreas Thust, and Dr. Dorin Geiger, and the financial support by the German Research Foundation are gratefully acknowledged.