Evaluation of error in the measurement of displacement vector components by using electronic speckle pattern interferometry

Optics Communications

Volumn 271, Issue 2, 2007, Pages 445-450

  Martínez, Amalia ^a   Rayas, J A ^a  

^a CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

Author keywords

ESPI; In plane and out of plane displacements; Optical metrology; Sensitivity matrix

Indexed keywords

ELECTRONIC PROPERTIES; INTERFEROMETRY; OPTICAL PROPERTIES; SENSITIVITY ANALYSIS; SPECKLE; VECTORS;

ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI); IN-PLANE AND OUT-OF-PLANE DISPLACEMENTS; OPTICAL METROLOGY; SENSITIVITY MATRIX;

ERROR ANALYSIS;

EID: 33846302787     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2006.10.046     Document Type: Article

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