Phase unwrapping for dual-beam electronic speckle pattern interferometry: Method

Applied Optics

Volumn 36, Issue 1, 1997, Pages 266-276

  Yoshida, S ^a   Widiastuti, Suprapedi R ^a   Septriyanti, Marincan ^a   Faisal, Julinda A ^a   Kusnowo, A ^a  

^a The Research and Development Center for Applied Physics   (Indonesia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000321516     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.000266     Document Type: Article

References (8)

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2. S. Yoshida, Y. Hida, V. E. Panin, and L. B. Zuev, in “Application of the wave theory of plastic deformation to a novel scheme of nondestructive analysis of mechanical behavior of solid-state object,” in Proceedings of the 10th International Conference on the Strength of Materials, H. Oikawa, K. Maruyama, S. Takeu-chi, and M. Yamaguchi, eds. (The Japan Institute of Metals, Sendai, 1994), pp. 295-298.
3. V. E. Panin, “Physical basis of mesomechanics on plastic deformation and fracture of solid-state materials (Russian),” in Physical Mesomechanics and Computer-Aided Design of Materials, V. E. Panin, ed. (Nauka, Novosibirsk, 1995), Vol. 1, pp. 7-28.
4. V. E. Panin, Institute of Strength Physics and Material Science of the Russian Academy of Sciences Siberian Branch, Aka-demicheski, Tomsk 634055, Russia (personal communication, 1995).
5. D. Kerr, F. Mendoza Santoyo, and J. R. Tyrer, “Extraction of phase data from electronic speckle pattern interferometric fringes using a single-phase-step method: a novel approach,” J. Opt. Soc. Am. A 7, 820-826 (1990).
6. G. H. Kaufmann, “Automatic fringe analysis procedures in speckle metrology,” in Speckle Metrology, R. S. Sirohi, ed., Vol. 38 of Optical Engineering (Marcel Dekker, New York, 1993), pp. 462-467.
7. S. Toyooka, H. Nishida, and J. Takezaki, “Automatic analysis of holographic and shearographic fringes to measure flexual strains in plates,” Opt. Eng. 28, 55-66 (1989).
8. S. Yoshida, Suprapedi, R. Widiastuti, E. T. Astuti, and A. Kus-nowo, “Phase evaluation for electronic speckle pattern inter-ferometry deformation analyses,” Opt. Lett. 20, 755-757 (1995).