Fiber electronic speckle pattern interferometry and its applications in residual stress measurements

Applied Optics

Volumn 37, Issue 28, 1998, Pages 6707-6715

  Zhang, Jingbo ^a,b   Chong, Tow Chong ^a  

^a DATA STORAGE INSTITUTE   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000532335     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.006707     Document Type: Article

References (37)

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