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Volumn 43, Issue 24, 2004, Pages 4652-4658

Three-dimensional deformation measurement from the combination of in-plane and out-of-plane electronic speckle pattern interferometers

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; DEFORMATION; ELECTRIC LIGHTING; HOLOGRAPHY; MATHEMATICAL MODELS; PATTERN RECOGNITION; SPECKLE;

EID: 4444310690     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.43.004652     Document Type: Article
Times cited : (57)

References (13)
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  • 5
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    • Influence of object roughness on specimen gratings for moiré interferometry
    • A. Martínez, R. Rodríguez-Vera, J. A. Rayas, and J. F. Vazquez, "Influence of object roughness on specimen gratings for moiré interferometry," Opt. Eng. 40, 1978-1983 (2001).
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  • 6
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  • 7
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    • 3D strain measurements using ESPI
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    • Winther, S.1
  • 8
    • 0037821927 scopus 로고    scopus 로고
    • Fast and full-field measurement of brake squeal using pulsed ESPI technique
    • R. Krupka, T. Walz, and A. Ettemeyer, "Fast and full-field measurement of brake squeal using pulsed ESPI technique," Opt. Eng. 42, 1354-1358 (2003).
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  • 9
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    • Transient deformation analysis by a carrier method of pulsed electronic speckle-shearing pattern interferometry
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  • 12
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.