A wide-dynamic-range CMOS image sensor based on multiple short exposure-time readout with multiple-resolution column-parallel ADC

IEEE Sensors Journal

Volumn 7, Issue 1, 2007, Pages 151-157

  Sasaki, Masaaki ^a,b   Mase, Mitsuhito ^c   Kawahito, Shoji ^a,d   Tadokoro, Yoshiaki ^a,e  

^a IEEE   (Japan)

^b SENDAI NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

^c CENTRAL RESEARCH LABORATORY   (Japan)

^d SHIZUOKA UNIVERSITY   (Japan)

^e TOYOHASHI UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

CMOS image sensor; Multiple exposure; Multiresolution analog to digital converter (ADC); Wide dynamic range

Indexed keywords

CMOS IMAGE SENSOR; MULTIPLE-EXPOSURE; MULTIRESOLUTION ANALOG-TO-DIGITAL CONVERTER (ADC); WIDE DYNAMIC RANGE;

ANALOG TO DIGITAL CONVERSION; CMOS INTEGRATED CIRCUITS; OPTICAL RESOLVING POWER; READOUT SYSTEMS;

SENSORS;

EID: 33846286044     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2006.888058     Document Type: Article

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