640×512 CMOS image sensor with ultrawide dynamic range floating-point pixel-level ADC

IEEE Journal of Solid-State Circuits

Volumn 34, Issue 12, 1999, Pages 1821-1834

  Yang, David X D ^a   El Gamal, Abbas ^a   Fowler, Boyd ^a   Tian, Hui ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; DIGITAL ARITHMETIC; IMAGE ENHANCEMENT; IMAGE QUALITY; IMAGE SENSORS; NYQUIST DIAGRAMS; QUANTUM EFFICIENCY; RANDOM ACCESS STORAGE; RESPONSE TIME (COMPUTER SYSTEMS); SAMPLING; SENSITIVITY ANALYSIS; SIGNAL TO NOISE RATIO;

ACTIVE PIXEL SENSORS (APS); ULTRAWIDE DYNAMIC RANGE FLOATING-POINT PIXEL-LEVELS;

CMOS INTEGRATED CIRCUITS;

EID: 0033280147     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.808907     Document Type: Article

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