A wide dynamic range CMOS image sensor with multiple exposure-time signal outputs and 12-bit column-parallel cyclic A/D converters

IEEE Journal of Solid-State Circuits

Volumn 40, Issue 12, 2005, Pages 2787-2795

  Mase, Mitsuhito ^b,e   Kawahito, Shoji ^a,b,e,f,g   Sasaki, Masaaki ^a,c,e   Wakamori, Yasuo ^d   Furuta, Masanori ^a,b  

^a IEEE

^b SHIZUOKA UNIVERSITY   (Japan)

^c SENDAI NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

^d YAMAHA CORPORATION   (Japan)

^e Institute of Image Information and Television Engineers of   (Japan)

^f Institute of Electronics   (Japan)

^g Intl Soc for Optical Engineering

Author keywords

Burst readout multiple exposure; Column parallel cyclic A D converter; Wide dynamic range

Indexed keywords

BURST READOUT MULTIPLE EXPOSURE; COLUMN-PARALLEL CYCLIC A/D CONVERTERS; DYNAMIC RANGE; WIDE DYNAMIC RANGE;

ANALOG TO DIGITAL CONVERSION; CMOS INTEGRATED CIRCUITS; READOUT SYSTEMS; SIGNAL PROCESSING;

IMAGE SENSORS;

EID: 29044445220     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2005.858477     Document Type: Conference Paper

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