In-pixel autoexposure CMOS APS

IEEE Journal of Solid-State Circuits

Volumn 38, Issue 8, 2003, Pages 1425-1428

  Yadid Pecht, Orly ^a   Belenky, Alexander ^a  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

Author keywords

Active pixel sensor (APS); CMOS imagers; Column parallel architecture; Dynamic range; Image sensor; Integration time; VLSI

Indexed keywords

ENERGY DISSIPATION; IMAGE SENSORS; LIGHTING; REAL TIME SYSTEMS; VLSI CIRCUITS;

ACTIVE PIXEL SENSORS (APS);

CMOS INTEGRATED CIRCUITS;

EID: 0041695204     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2003.811984     Document Type: Article

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