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Volumn 17, Issue 21, 2006, Pages 5363-5366

Bulk micromachining of silicon using electron-beam-induced carbonaceous nanomasking

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRON BEAMS; ETCHING; MASKS; MICROMACHINING; NANOSTRUCTURED MATERIALS; THIN FILMS;

EID: 33846096818     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/21/013     Document Type: Article
Times cited : (9)

References (18)
  • 6
    • 0040006072 scopus 로고
    • Critical technologies for the micromachining of silicon
    • Kendall D L, Malloy K J and Fledermann C B 1992 Critical technologies for the micromachining of silicon Semiconductors and Metals vol 37 ed K T Faber and K J Malloys (New York: Academic) pp293-337
    • (1992) Semiconductors and Metals , vol.37 , pp. 293-337
    • Kendall, D.L.1    Malloy, K.J.2    Fledermann, C.B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.