Conductive supertips for scanning probe applications

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 15, Issue 4, 1997, Pages 1535-1538

  Schossler C ^a   Urban, J ^a   Koops, H W P ^b  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b DEUTSCHE TELEKOM LABORATORIES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 1942509045     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589394     Document Type: Article

References (12)

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