Magnetic linear dichroism studies of in situ grown NiO thin films

Journal of Magnetism and Magnetic Materials

Volumn 310, Issue 1, 2007, Pages 8-12

  Krishnakumar, S R ^a   Liberati, M ^b,c   Grazioli, C ^d   Veronese, M ^d   Turchini, S ^d   Luches, P ^c   Valeri, S ^c   Carbone, C ^d  

^a ABDUS SALAM INTERNATIONAL CENTRE FOR THEORETICAL PHYSICS   (Italy)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^c CNR Consiglio Nazionale delle Ricerche   (Italy)

^d CNR   (Italy)

Author keywords

Antiferromagnetism; Magnetic linear dichroism; Nickel oxide; Thin films

Indexed keywords

ANISOTROPY; ANTIFERROMAGNETISM; FILM GROWTH; NICKEL COMPOUNDS; STRAIN MEASUREMENT; SUBSTRATES; THICKNESS MEASUREMENT;

MAGNETIC DOMAIN ALIGNMENTS; MAGNETIC LINEAR DICHROISM (MLD); NICKEL OXIDES;

MAGNETIC THIN FILMS;

EID: 33846013892     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2006.07.020     Document Type: Article

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