Growth of NiO and MgO Films on Ag(100)

Thin Solid Films

Volumn 400, Issue 1-2, 2001, Pages 1-8

  Wollschlager J ^a   Erdos D ^a   Goldbach, H ^a   Hopken R ^a   Schroder K M ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

Diffraction spot profile analysis; Heteroepitaxy; Low energy electron diffraction; Oxide growth; Relaxation; Surface morphology

Indexed keywords

CRYSTAL ORIENTATION; LOW ENERGY ELECTRON DIFFRACTION; MAGNESIA; NICKEL COMPOUNDS; SURFACE PHENOMENA; THERMAL EFFECTS;

DIFFRACTION SPOT PROFILE ANALYSIS;

FILM GROWTH;

EID: 0035803248     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01482-1     Document Type: Conference Paper

References (36)

1. New materials for refractory tunneling junctions: Fundamental aspects