EELS investigation of thin epitaxial NiO/Ag(001) films: Surface states in the multilayer, monolayer and submonolayer range

Surface Science

Volumn 459, Issue 1, 2000, Pages 161-172

  Muller F ^a   De Masi, R ^a   Steiner, P ^a   Reinicke, D ^a   Stadtfeld, M ^a   Hufner S ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON ENERGY LOSS SPECTROSCOPY; EPITAXIAL GROWTH; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MONOLAYERS; MULTILAYERS; NICKEL COMPOUNDS; SILVER; ULTRATHIN FILMS;

NICKEL OXIDE; PHOTOELECTRON DIFFRACTION;

SURFACE PHENOMENA;

EID: 0038528662     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00464-7     Document Type: Article

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