Growth, structure and epitaxy of ultrathin NiO films on Ag(001)

Thin Solid Films

Volumn 400, Issue 1-2, 2001, Pages 139-143

  Luches, P ^a   Altieri, S ^a   Giovanardi, C ^a   Moia, T S ^a   Valeri, S ^a   Bruno, F ^b   Floreano, L ^b   Morgante, A ^b,c   Santaniello, A ^d   Verdini, A ^b   Gotter, R ^b   Hibma, T ^e  

^a UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^b LABORATORIO TASC   (Italy)

^c UNIVERSITY OF TRIESTE   (Italy)

^d SINCROTRONE TRIESTE   (Italy)

^e UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

Epitaxy; Nickel oxide; Photoelectron diffraction; Silver; Specular X ray reflectivity

Indexed keywords

CONTAMINATION; CRYSTAL STRUCTURE; FILM GROWTH; NICKEL COMPOUNDS; REFLECTION; SILVER; SINGLE CRYSTALS; STOICHIOMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

PHOTOELECTRON DIFFRACTION;

ULTRATHIN FILMS;

EID: 0035803190     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01496-1     Document Type: Conference Paper

References (14)