Extended data analysis strategies for high resolution imaging MS: New methods to deal with extremely large image hyperspectral datasets

International Journal of Mass Spectrometry

Volumn 260, Issue 2-3, 2007, Pages 222-236

  Klerk, Leendert A ^a   Broersen, Alexander ^b   Fletcher, Ian W ^c   van Liere, Robert ^b   Heeren, Ron M A ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

^b CWI   (Netherlands)

^c AKZO NOBEL CENTRAL RESEARCH   (Netherlands)

Author keywords

Imaging mass spectrometry; Multivariate analysis; Polymer additives; Principal component analysis; Synthetic polymers

Indexed keywords

EID: 33845910712     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2006.11.014     Document Type: Article

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