Sn-whiskers: Truths and myths

Journal of Materials Science: Materials in Electronics

Volumn 18, Issue 1-3, 2007, Pages 283-305

  Osenbach, J W ^a   DeLucca, J M ^a   Potteiger, B D ^a   Amin, A ^a   Baiocchi, F A ^a  

^a AGERE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; MATHEMATICAL MODELS; RISK MANAGEMENT; SOLID STATE DEVICES; TIN;

MITIGATION STRATEGY; WHISKER GROWTH;

CRYSTAL WHISKERS;

EID: 33845718807     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-006-9030-6     Document Type: Review

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